Category Archives: Journal

The paper entitled “Improving Error Correction Codes for Multiple-Cell Upsets in Space Applications”, written by Joaquín Gracia-Morán, Luis J. Saiz-Adalid, Daniel Gil-Tomás, and Pedro J. Gil-Vicente has been accepted at the IEEE Transactions on VLSI. Abstract: Currently, faults suffered by SRAM memory systems have increased due to the aggressive CMOS integration density. Thus, the probability [...]

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