The paper entitled “Ultrafast Codes for Multiple Adjacent Error Correction and Double Error Detection”, authored by Luis-J. Saiz-Adalid, Joaquín Gracia-Morán, Daniel Gil-Tomás, J.-Carlos Baraza-Calvo and Pedro-J. Gil-Vicente has been accepted at IEEE Access.
Reliable computer systems employ error control codes (ECCs) to protect information from errors. For example, memories are frequently protected using single error correction-double error detection (SEC-DED) codes. ECCs are traditionally designed to minimize the number of redundant bits, as they are added to each word in the whole memory. Nevertheless, using an ECC introduces encoding and decoding latencies, silicon area usage and power consumption. In other computer units, these parameters should be optimized, and redundancy would be less important. For example, protecting registers against errors remains a major concern for deep sub-micron systems due to technology scaling. In this case, an important requirement for register protection is to keep encoding and decoding latencies as short as possible. Ultrafast error control codes achieve very low delays, independently of the word length, increasing the redundancy. This paper summarizes previous works on Ultrafast codes (SEC and SEC-DED), and proposes new codes combining double error detection and adjacent error correction. We have implemented, synthesized and compared different Ultrafast codes with other state-of-the-art fast codes. The results show the validity of the approach, achieving low latencies and a good balance with silicon area and power consumption.
Last 18 September, J. Gracia-Morán presented the paper entitled “Mejora de un Código de Corrección de Errores para tolerar fallos adyacentes bidimensionales” at the Jornadas SARTECO 2019.