Paper accepted at Electronics Journal
The paper entitled “Fault Modeling of Graphene Nanoribbon FET Logic Circuits”, written by D. Gil-Tomàs, J. Gracia-Morán, L.J. Saiz-Adalid and P.J. Gil-Vicente has been accepted for publication at Electronics Journal. Abstract: Due to the increasing defect rates in highly scaled complementary metal–oxide–semiconductor (CMOS) devices, and the emergence of alternative nanotechnology devices, reliability challenges are of [...]
DSN 2020 will be held at UPV
The Fault Tolerant Systems Group (STF) of the Institute ITACA from the UPV will host the next International Conference on Dependable Systems and Networks (DSN), that will be held in Valencia in June 2020. Over the years, the International Conference on Dependable Systems and Networks has pioneered the fusion between dependability and security research, understanding [...]